Inspection / Measurement

2D Inspection Technology

High-speed, high-resolution inspection enabled by ultra-precision
optics and line-scan technology

We deliver advanced 2D vision inspection capabilities that detect micro-level
defects at sub-micron resolution in precision manufacturing environments,
including display, semiconductor, and battery production.

High-speed, high-precision inspection using high-resolution and line-scan cameras
Inspection using diverse light sources, including visible, IR, UV and laser
Surface defects, contamination, scratches, cracks, open/short, and GD&T
Sub-micron defect detection capability
Applications in display, semiconductor, and battery manufacturing

2.5D Inspection Technology

2.5D surface inspection using Photometric Stereo with multi-directional illumination

We provide Photometric Stereo-based 2.5D inspection that reconstructs
surface normal and gradient information using multi-directional illumination
and image fusion, enabling precise detection of micro-scale surface
irregularities and defects.

High-speed 2.5D reconstruction using multi-channel simultaneous imaging
or strobe-sequenced acquisition, optimized for process speed and installation constraints
Lighting-synchronized line-scan imaging with trigger integration, combined with hardware/
software-based image demultiplexing for image separation, alignment, and reconstruction
Surface analysis based on normal and gradient maps, including relative height information
Precision inspection of surface defects such as scratches, dents, contamination, bumps, and stains
Applications in display, glass, semiconductor, battery, metal, film, and injection-molded part manufacturing

3D Measurement Technology

High-performance 3D profiling and measurement for precise analysis
of complex geometries

We provide advanced 3D measurement capabilities that capture and analyze height,
depth, curvature, and other dimensional data in real time, enabling precise
inspection beyond convetional 2D methods.

Measurement based on chromatic confocal, laser triangulation, WSI, and stereo vision
Thin-film thickness measurement using ellipsometry and reflectometry
Real-time processing and evaluation of large-scal 3D measurement data
Precision measurement and inspection of flatness, warpage, thickness, and roughness
Applications in display, semiconductor(bump, BGA), and battery manufacturing